Substrate Temperature-Dependent Physical Properties of Thermally Evaporated Sn4Sb6S13 Thin Films
نویسندگان
چکیده
منابع مشابه
Thermal Annealing Influence over Optical Properties of Thermally Evaporated SnS/CdS Bilayer Thin Films
Thin films of tin sulfide/cadmium sulfide (SnS/CdS) were prepared bythermal evaporation method at room temperature on a glass substrate and then annealedat different temperature with the aim of optimizing the optical properties of the materialfor use in photovoltaic solar cell devices. The effect of annealing on optical propertiesof SnS/CdS film was studied in the temper...
متن کاملInvestigation of Physical Properties of e-Beam Evaporated CdTe Thin Films for Photovoltaic Application
CdTe thin films with 2.8 µm thickness were deposited by electron beam evaporation method. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and atomic force microscopy (AFM) were used to characterize the films. The results of AFM analysis revealed that the CdTe films have uniform surface. CdTe thin films were heat-treated by SnCl2 solution. Structural analysis using XRD s...
متن کاملTunable Photoluminescence via Thermally Evaporated ZnS Ultra Thin Films
ZnS thin films have been deposited by thermal evaporation at various deposition rates. By controlling the deposition rate, the position of the maximum in the photoluminescence spectra could be easily tuned from 2.9 to 2.0 eV, which produced a corresponding change in the emission color. The optical and morphological characteristics of the ZnS thin films were measured. The photoluminescence spect...
متن کاملOPTICAL PROPERTIES OF THIN Cu FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE
Copper films (250 nm) deposited on glass substrates, at different substrate temperatures. Their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. Kramers Kronig method was used for the analysis of the reflectivity curves of Cu films to obtain the optical constants of the films, while ellipsometery measu...
متن کاملThickness dependence of the dielectric properties of thermally evaporated Sb2Te3 thin films
Sb2Te3 thin films of different thickness (23 350 nm) were prepared by thermal evaporation technique. The thickness dependence of the ac conductivity and dielectric properties of the Sb2Te3 films have been investigated in the frequency range 10 Hz100 kHz and within the temperature range 293373K. Both the dielectric constant ε1 and dielectric loss factor ε2 were found to depend on frequency, temp...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Acta Metallurgica Sinica (English Letters)
سال: 2016
ISSN: 1006-7191,2194-1289
DOI: 10.1007/s40195-015-0364-z